| Bahan Kajian | - Analisis Luas Permukaan: BET (Brunauer, Emmett, dan Teller)
- Sifat Elektrokimia: CV (Voltametri Siklik) dan EIS (Spektroskopi Impedansi Listrik)
- Resonansi Plasmon Permukaan (SPR) dan Hamburan Cahaya Dinamis (DLS)
- XPS (Spektroskopi Fotoelektron Sinar-X)
- Analisis Unsur: XRF (Fluoresensi Sinar-X), AAS (Spektrometri Serapan Atom), Spektrometri Emisi Optik (OES)
- Pencitraan Resolusi Atom: TEM (Mikroskop Elektron Transmisi)
- Mikroskop Pemindaian Probe: AFM (Mikroskop Gaya Atom), STM (Mikroskop Pemindaian Tunneling)
- Scanning Probe Microscopy: AFM (Atomic Force Microscope), STM (Scanning Tunneling Microscope)
- Analisis Termal: DSC (Kalorimetri Pemindaian Diferensial)
| - Advance Material Characterization
- Surface Area Analysis: BET (Brunauer, Emmett and Teller)
- Electrochemical Properties: CV (Cyclic Voltammetry) and EIS (Electrical Impedance Spectroscopy)
- Surface plasmon resonance (SPR) and Dynamic Light Scattering (DLS)
- XPS (X-ray photoelectron spectroscopy)
- Elemental Analysis: XRF (X-Ray Fluorescence), AAS (Atomic absorption spectrometry), Optical emission spectrometry (OES)
- Atomic Resolution Imaging: TEM (Transmission Electron Microscope)
- Scanning Probe Microscopy: AFM (Atomic Force Microscope), STM (Scanning Tunneling Microscope)
- Thermal Analysis: DSC (Differential scanning calorimetry)
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| Capaian Pembelajaran Mata Kuliah (CPMK) | - Memiliki pengetahua dasar yang kuat dalam sifat-sifat bahan nano (misalnya ukuran, bentuk, luas permukaan, komposisi, struktur) dan dampaknya terhadap perilaku material.
- Memahami prinsip, landasan teori, prinsip kerja berbagai teknik karakterisasi (misalnya analisa surface area, analisa termal, analisa electrokimia).
- Memahami kekuatan, keterbatasan, dan penerapan yang tepat dari metode karakterisasi yang berbeda.
- Dapat menunjukan pengetahuan tentang prosedur pengoperasian berbagai peralatan karakterisasi (misalnya BET, TG-DTA, EIS).
- Dapat menganalisis, dan menafsirkan data dari berbagai teknik karakterisasi, menarik kesimpulan yang bermakna dan mengidentifikasi potensi kesalahan.
| - Demonstrate a strong foundation in the properties of nanomaterials (e.g., size, shape, surface area, composition, structure) and their impact on material behavior.
- Grasp the principles, theoretical basis, working principles of various characterization techniques (eg surface area analysis, thermal analysis, electrochemical analysis).
- Understand the strengths, limitations, and proper application of different characterization methods.
- Demonstrated knowledge of operating procedures of various characterization equipment (e.g. BET, TG-DTA, EIS)
- Analyze, and interpret data from various characterization techniques, draw meaningful conclusions and identify potential errors.
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