| Bahan Kajian | - Analisis Luas Permukaan: BET (Brunauer, Emmett, dan Teller)
- Sifat Elektrokimia: CV (Voltametri Siklik) dan EIS (Spektroskopi Impedansi Listrik)
- Resonansi Plasmon Permukaan (SPR) dan Hamburan Cahaya Dinamis (DLS)
- XPS (Spektroskopi Fotoelektron Sinar-X)
- Analisis Unsur: XRF (Fluoresensi Sinar-X), AAS (Spektrometri Serapan Atom), Spektrometri Emisi Optik (OES)
- Pencitraan Resolusi Atom: TEM (Mikroskop Elektron Transmisi)
- Mikroskop Pemindaian Probe: AFM (Mikroskop Gaya Atom), STM (Mikroskop Pemindaian Tunneling)
- Scanning Probe Microscopy: AFM (Atomic Force Microscope), STM (Scanning Tunneling Microscope)
- Analisis Termal: DSC (Kalorimetri Pemindaian Diferensial)
| - Advance Material Characterization
- Surface Area Analysis: BET (Brunauer, Emmett and Teller)
- Electrochemical Properties: CV (Cyclic Voltammetry) and EIS (Electrical Impedance Spectroscopy)
- Surface plasmon resonance (SPR) and Dynamic Light Scattering (DLS)
- XPS (X-ray photoelectron spectroscopy)
- Elemental Analysis: XRF (X-Ray Fluorescence), AAS (Atomic absorption spectrometry), Optical emission spectrometry (OES)
- Atomic Resolution Imaging: TEM (Transmission Electron Microscope)
- Scanning Probe Microscopy: AFM (Atomic Force Microscope), STM (Scanning Tunneling Microscope)
- Thermal Analysis: DSC (Differential scanning calorimetry)
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| Capaian Pembelajaran Mata Kuliah (CPMK) | - Menganalisis prinsip fisika dan kimia yang mendasari teknik karakterisasi material lanjut, termasuk analisis ukuran partikel (PAS), karakterisasi mikroskopis (SEM, TEM, AFM), BET, teknik elektrokimia, dan SPR.
- Mengevaluasi dan memilih teknik karakterisasi yang paling sesuai untuk menjawab permasala- han ilmiah tertentu, dengan mempertimbangkan resolusi, sensitivitas, keterbatasan metode, dan jenis material.
- Menganalisis dan menginterpretasikan data eksperimen yang diperoleh dari PAS, SEM, TEM, AFM, BET, karakterisasi elektrokimia (CV, EIS), dan SPR secara kritis dan kuantitatif.
- Mengintegrasikan hasil dari berbagai teknik karakterisasi untuk menjelaskan hubungan struktur–sifat–fungsi material, serta implikasinya terhadap aplikasi material.
- Mengevaluasi keandalan, ketidakpastian, dan keterbatasan data karakterisasi, termasuk sumber kesalahan eksperimen dan reprodusibilitas hasil.
- Merancang strategi karakterisasi material lanjut yang komprehensif untuk mendukung peneli- tian tesis, dengan mengombinasikan teknik yang relevan dan justifikasi ilmiah yang kuat.
- Mengkomunikasikan hasil dan analisis karakterisasi material lanjut secara lisan dan tertulis dengan format ilmiah yang tepat.
| - Analyze the physical and chemical principles underlying advanced material characterization techniques, including particle size analysis (PAS), microscopic characterization (SEM, TEM, AFM), BET, electrochemical techniques, and SPR.
- Evaluate and select the most appropriate characterization techniques to address specific scientific problems by considering resolution, sensitivity, methodological limitations, and material type.
- Analyze and interpret experimental data obtained from PAS, SEM, TEM, AFM, BET, electrochemical characterization (CV, EIS), and SPR critically and quantitatively.
- Integrate results from various characterization techniques to explain the structure–property–function relationships of materials, as well as their implications for material applications.
- Evaluate the reliability, uncertainty, and limitations of the characterization data, including the sources of experimental error and the reproducibility of the results.
- Design a comprehensive advanced material characterization strategy to support thesis research by combining relevant techniques with strong scientific justification.
- Communicate the results and analysis of advanced material characterization both orally and in writing using appropriate scientific formats and conventions.
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