| Kode Mata Kuliah | KI4031 / 3 SKS |
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| Penyelenggara | 105 - Kimia / FMIPA |
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| Kategori | Kuliah |
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| Bahasa Indonesia | English |
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| Nama Mata Kuliah | Pengantar Metode Difraksi | Introduction to Diffraction Methods |
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| Bahan Kajian | - Kristal dan sistem kristal
- Kisi kristal
- Simetri
- Sinar-X
- Hamburan sinar-X
- Intensitas difraksi
- Pengukuran difraksi sinar-X
- Indeksasi pola difraksi
- Refinement data difraksi
- Analisis stress dan tekstur material
| - Crystals and crystal systems
- Crystal lattice
- Symmetry
- X-ray
- X-ray scattering
- Diffraction intensity
- X-ray diffraction measurements
- Diffraction pattern indexation
- Diffraction data refinement
- Stress and material texture analysis
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| Capaian Pembelajaran Mata Kuliah (CPMK) | - Mampu memahami kaitan simetri dengan struktur kristal, dan interaksinya dengan gelombang sinar-X untuk penentuan struktur kristal.
- Mampu menyiapkan sampel dan melakukan pengukuran difraksi sinar-X, serta menganalisis data hasil pengukurannya.
| - Able to understand the relationship between symmetry and crystal structure, and its interaction with X-ray waves for determining crystal structure.
- Able to prepare samples and carry out X-ray diffraction measurements, as well as analyze the measurement data.
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| Metode Pembelajaran | Ceramah, praktikum, tutorial, studi kasus | Lectures, practicums, tutorials, case studies |
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| Modalitas Pembelajaran | Luring Sinkron
Daring Asinkron | Synchronous Offline
Asynchronous Online |
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| Jenis Nilai | ABCDE |
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| Metode Penilaian | Tugas, UTS, Praktikum | Assignments, Midterm exams, Practicum |
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| Catatan Tambahan | | |
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